C QUAND

On-line XRF elemental analysis in liquids

The C-QUAND is a sensitive yet robust, easy to operate & maintain, continuous process analyzer which will enable the optimization of your plant process. With its broad range from Silicon (Z=14) to Uranium (Z=92), the C-QUAND comes into its own in various applications such Total Sulphur measurement, salt-in-crude oil, chlorine in sour water, metals in crude oil and SAF/HVO production, and many other applications (please consult factory).

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Key Benefits

  • Continuous multi-element analysis
  • Close to no maintenance
  • Automated zero and span correction
  • Suitable for hazardous and harsh area’s
  • Consistent with ASTM and ISO
  • 24/7 support through remote access
  • Long life SDD and X-Ray tube

C QUAND

On-line XRF elemental analysis in liquids
C QUAND
C QUAND
C QUAND
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C QUAND
C QUAND
C QUAND
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Product Comparison
Applications
More Information
Tech Specs
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Product Comparison

In the table below, you may find the differences of the two C-QUAND variants available:

Model C-QUAND-ELT C-QUAND PLUS
Technology ED-XRF ED-XRF
Integrated automated flushing system No Yes
Sample Recovery System Optionally Optionally
Typical Applications Metals refining and recycling, Waste water streams, PTA & PIA plants, and/or other acidic and aqueous samples. (Ultra) low Sulphur measurement in fuels and/or other highly sensitive (low range) measurements that may be prone to window fouling.

Applications

Catalyst measurement in PIA and PTA Plants
Metals refining and recycling
Total Sulphur measurement in fuels
Waste water streams

More Information

Our Technology

The non-destructive ED-XRF, X-Ray method has a long-proven track record in the industry for the measurement of elements in liquids. The technology delivers low OPEX costs with high availability (>99.5%). The C-QUAND analyzer offers excellent repeatability with the guarantee of drift-free measurement in the low and high concentration ranges.

The C-QUAND – which has no problematic moving parts – features integrated auto-validation on a solid reference material. The heated sample cell handles more viscous samples and measures at process temperature. Both the sampling system and analyzer wetted parts are available in acid resistant materials. The net effect is a continuous, non-destructive, low maintenance analyzer with calibration intervals of typically more than one year. Considerable savings in analysis time and operational cost – in comparison to alternative analytical techniques – are two of the main benefits of the C-QUAND. It is a robust product fit for harsh process environments and can be fully integrated in process monitoring and control.

X-Ray Fluorescence Principle

The C-QUAND has a powerful 15 watt, 50 kV X-ray source, with a silver anode. The X-rays displace the inner electron out from the K or L orbit of the atom, leaving a void. The now unstable atom will immidiately fill the void with an electron from the outer orbits. The resulting reduction in energy is emitted as a photon with a specific energy level unique to that particular element. The fluorescence is captured by a silicon drift detector (SDD). It’s count rate being monitored directly proportional to the concentration of the element of interest.

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Measuring cell

The X-rays generated by the source are first filtered by one of six different optical filters. The X-rays then travel through a thin window before hitting the actual sample. The window material can be beryllium for sulfur measurement in hydrocarbons, or a polyimide such as Kapton® or Upilex® for the measurement of metals in aqueous solutions.

The measuring cell is constantly flushed with fresh samples. Importantly, this method of measurement is continuous throughout the entire measurement, not just at the beginning. The measuring cell also contains a solid reference metal, which is used for automatic gain correction.

Technical Specification

Analytical
Measurement principle Energy dispersive X-ray fluorescence
Element range From Si (Z=14)
Measurement range From 0.5 ppm to % levels (application specific)
Simultaneous elements Up to 8 elements/analysis
Accuracy Depending on application
Calibration Less than 5 samples
Central processing and controlling unit
Industrial PC Custom touch keyboard with 8" TFT color display
Analog outputs 2 or 4 x 4-20mA active
Communications 4 – 20 mA, MODBUS via RS485 or TCP/IP, Optical Fiber
Ambient temperature 5 – 40°C / 41 – 104°F
measurement head
X-ray detector Sillicon drift detector, resolution 135 eV (equals 2.3% at 5.89keV)
HV power supply 0-50kV
Source 15W X-ray tube, air-cooled by internal fan
Stability Automatic drift and back scatter peak correction; temperature and ambient pressure correction
Sample window Kapton®, Upilex®, beryllium
utility requirements
Power supply 110-230 VAC 50/60 Hz
Power consumption 100 VA (150 VA with heated sample cell)
Instrument air <4 L/min for Exp. version and required for standard pneumatic valve (electrical actuated valve optional)
Sample conditions

Downloads

C-QUAND Brochure
C-QUAND Application Notes

Questions? Our expert is ready for you

Albert Mouris, CTO
Albert Mouris, CTO
T
+31 (0)299 420 871
(office)
Hobré Instruments B.V.
T
+31 (0)299 393 118
(direct)
Netwerk 4, 1446 WK Purmerend
M
-
The Netherlands

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